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青野 博之*; 武田 伸一郎*; 石川 真之介*; 小高 裕和*; 国分 紀秀*; 渡辺 伸*; 高橋 忠幸*; 中澤 知洋*; 奥山 翔*; 田島 宏康*; et al.
no journal, ,
We have developed a low noise double-sided silicon strip detector for hard X-ray imaging spectroscopy. Development of low-noise analog electronics, optimized double-sided silicon strip detectors and a compact assembly technology realized the high-quality X-ray imaging device with fine energy, position and timing resolutions, and good uniformity. Imaging detectors in 10-100 keV would be attractive in various fields such as astrophysics, medical and nondestructive inspection. For these purposes, the development the next generation Compton Camera is now underway.